Dynamics of resonant x-ray and Auger scattering
Faris Gel’mukhanov, Michael Odelius, Sergey P. Polyutov, Alexander Föhlisch, Victor Kimberg
Abstract
With high brightness and tunable resolution, x-ray synchrotron light sources have enhanced the ability to characterize materials. This experimental and theoretical overview of elastic and inelastic x-ray and resonant Auger element-specific scattering processes enabled by these tools provides an updated and comprehensive perspective on electron-nuclear dynamics together with the structural aspects of a broad variety of materials. Materials characterized using these techniques include liquids, gases, molecules, solids with correlated excitations, Mott insulators, and semiconductors.
Topics & Concepts
AugerPhysicsResonant inelastic X-ray scatteringSynchrotronScatteringBrightnessSynchrotron radiationAtomic physicsInelastic scatteringAuger effectSemiconductorAuger electron spectroscopyOpticsNuclear physicsX-ray Raman scatteringOptoelectronicsHigh-pressure geophysics and materialsX-ray Spectroscopy and Fluorescence AnalysisCrystallography and Radiation Phenomena