YOLO-Pdd: A Novel Multi-scale PCB Defect Detection Method Using Deep Representations with Sequential Images
Bowen Liu, Dongjie Chen, Xiao Qi
Topics & Concepts
Computer scienceScale (ratio)Artificial intelligenceComputer visionComputer graphics (images)Pattern recognition (psychology)CartographyGeographyIndustrial Vision Systems and Defect DetectionImage and Object Detection TechniquesIntegrated Circuits and Semiconductor Failure Analysis