Litcius/Paper detail

A CM&CP framework with a GIACC method and an ensemble model for remaining useful life prediction

Yaping Li, Tengfei Han, Tangbin Xia, Zhen Chen, Ershun Pan

2022Computers in Industry21 citationsDOI

Topics & Concepts

Cluster analysisEnsemble forecastingData miningComputer scienceSimilarity (geometry)Ensemble learningArtificial intelligenceMachine learningMeasure (data warehouse)Predictive modellingImage (mathematics)Machine Fault Diagnosis TechniquesReliability and Maintenance OptimizationGrey System Theory Applications