Fault diagnosis and prognosis based on physical knowledge and reliability data: Application to MOS Field-Effect Transistor
Mohand Djeziri, Samir Benmoussa, Moamar Sayed Mouchaweh, Edwin Lughofer
Topics & Concepts
Robustness (evolution)Reliability (semiconductor)Reliability engineeringComputer scienceInitializationField (mathematics)Data miningTransistorEngineeringMathematicsElectrical engineeringPure mathematicsPower (physics)GeneProgramming languageBiochemistryChemistryVoltagePhysicsQuantum mechanicsReliability and Maintenance OptimizationIntegrated Circuits and Semiconductor Failure AnalysisMachine Fault Diagnosis Techniques