Investigation of Noise Characteristics in Gate-Source Overlap Tunnel Field-Effect Transistor
Sanjeet Kumar Sinha, Sweta Chander, Rekha Chaudhary
Topics & Concepts
Materials scienceTransistorCapacitanceOptoelectronicsField-effect transistorCurrent sourceNoise (video)Current (fluid)Electrical engineeringVoltagePhysicsElectrodeComputer scienceEngineeringImage (mathematics)Quantum mechanicsArtificial intelligenceAdvancements in Semiconductor Devices and Circuit DesignSemiconductor materials and devicesIntegrated Circuits and Semiconductor Failure Analysis