A MIP model and a biased random-key genetic algorithm based approach for a two-dimensional cutting problem with defects
José Fernando Gonçalves, Gerhard Wäscher
Topics & Concepts
AlgorithmKey (lock)Benchmark (surveying)Genetic algorithmComputer scienceRepresentation (politics)Mathematical optimizationSet (abstract data type)Series (stratigraphy)MathematicsBiologyGeodesyPolitical scienceComputer securityPaleontologyLawPoliticsProgramming languageGeographyOptimization and Packing ProblemsComputational Geometry and Mesh GenerationAdvanced Manufacturing and Logistics Optimization