Scaling limits of monolayer AlN and GaN MOSFETs
Hong Li, Yuhang Liu, Shuai Sun, Fengbin Liu, Jing Lü
Topics & Concepts
Materials scienceMOSFETTransistorMonolayerShort-channel effectScalingOptoelectronicsLimit (mathematics)Scaling limitField-effect transistorNanotechnologyPhysicsMathematicsVoltageQuantum mechanicsGeometryMathematical analysisGaN-based semiconductor devices and materialsSemiconductor materials and devicesAdvancements in Semiconductor Devices and Circuit Design