A weak supervision machine vision detection method based on artificial defect simulation
Changsheng Li, Yanjiang Huang, Hai Li, Xianmin Zhang
Topics & Concepts
Computer scienceArtificial intelligenceProcess (computing)Artificial visionMobile phoneMachine learningPattern recognition (psychology)Computer visionOperating systemTelecommunicationsIndustrial Vision Systems and Defect DetectionImage and Object Detection TechniquesImage Processing Techniques and Applications