Litcius/Paper detail

A lightweight convolutional neural network for recognition and classification for Si3N4 chip substrate surface defects

Liao Dahai, Zhihui Cui, Liao Xianqi, Qi Zheng, Nanxing Wu

2023Ceramics International11 citationsDOI

Topics & Concepts

Regularization (linguistics)Convolutional neural networkComputer sciencePattern recognition (psychology)Materials scienceFeature (linguistics)ChipGeneralizationArtificial intelligenceMathematicsPhilosophyMathematical analysisLinguisticsTelecommunicationsIndustrial Vision Systems and Defect DetectionIntegrated Circuits and Semiconductor Failure AnalysisNon-Destructive Testing Techniques
A lightweight convolutional neural network for recognition and classification for Si3N4 chip substrate surface defects | Litcius