The measurement of the dislocation density using TEM
Yang Meng, Xinhua Ju, Xiao-Peng Yang
Topics & Concepts
DislocationMaterials scienceDark field microscopyIntersection (aeronautics)Scanning transmission electron microscopyOpticsTransmission electron microscopyFOIL methodMicroscopyDepth of fieldDiffractionField (mathematics)PhysicsNanotechnologyComposite materialPure mathematicsEngineeringAerospace engineeringMathematicsAdvanced Electron Microscopy Techniques and ApplicationsIntegrated Circuits and Semiconductor Failure AnalysisElectron and X-Ray Spectroscopy Techniques