Comparison of EBSD, DIC, AFM, and ECCI for active slip system identification in deformed Ti-7Al
Ryan Sperry, Songyang Han, Zhe Chen, Samantha Daly, M.A. Crimp, David T. Fullwood
Topics & Concepts
Electron backscatter diffractionMaterials scienceDigital image correlationSlip (aerodynamics)DislocationComposite materialMicrostructureEngineeringAerospace engineeringMicrostructure and mechanical propertiesMetal and Thin Film MechanicsTitanium Alloys Microstructure and Properties