Optical study of Ga2-xSnxO3 (0 ≤ x ≤ 0.7) thin films using spectroscopic ellipsometry and cathodoluminescence
Thi Thu Tram Nguyen, Dae Ho Jung, Jae Jun Lee, Hosun Lee
Topics & Concepts
CathodoluminescenceBand gapThin filmAmorphous solidMaterials scienceAnalytical Chemistry (journal)EllipsometrySputter depositionCrystalliteRefractive indexAnnealing (glass)SemiconductorSputteringOptoelectronicsOpticsChemistryCrystallographyLuminescenceNanotechnologyPhysicsMetallurgyChromatographyComposite materialGa2O3 and related materialsZnO doping and propertiesAdvanced Photocatalysis Techniques