Metal–Semiconductor–Metal Metasurface for Multiband Infrared Stealth Technology Using Camouflage Color Pattern in Visible Range
Jagyeong Kim, Changhoon Park, Jae W. Hahn
Abstract
Abstract Optical stealth technology is being developed to cope with high‐sensitivity infrared image detectors and various guided detectors. Infrared stealth technology has remarkable performance; however, future advancements in multi‐band stealth technology covering the entire optical frequency range, from visible to wide infrared, are key challenges regarding unmanned surveillance systems. Thus, a metal–semiconductor–metal (MSM) metasurface with Fabry–Pérot (F–P) and multiple plasmonic resonant modes is introduced to realize multiband stealth technology. Different colors are obtained for printing camouflage patterns in the visible range using localized surface plasmon modes in Al disks on an opaque Ge layer. The F–P resonance of the Ge layer induces a strong absorption of >92% at 1.06 µm, reducing the guidance signal of the infrared laser‐guided detector. With an additional plasmonic resonance in the MSM metasurface, infrared signature reductions of >34%, >94.4%, and >97.7% are obtained for short‐wave, mid‐wave, and long‐wave infrared bands, respectively.