X-ray photoelectron spectroscopy study of a layered tri-chalcogenide system LaTe3
Shuvam Sarkar, Vipin Kumar Singh, Pampa Sadhukhan, Arnab Pariari, Shubhankar Roy, P. Mandal, S. R. Barman
Abstract
By employing x-ray photoelectron spectroscopy, we present a detailed study of the core level spectra of LaTe3 in its charge density wave phase at room temperature. The analysis of the Te 3d spectrum by curve fitting using least square error minimization reveals that the Te atoms exist in two different charge states: the two Te atoms in the Te-Te layer has a valency of −0.5, whereas the Te atom in La-Te layer has a valency of −2. The La 3d spectrum shows three peaks for each spin orbit component, where the main peak and the satellite peaks appear due to different final states related to charge transfer from different ligand Te states.
Topics & Concepts
ValencyX-ray photoelectron spectroscopyChalcogenideSpectroscopySpectral lineAtomic physicsMaterials scienceAtom (system on chip)Analytical Chemistry (journal)ChemistryMolecular physicsNuclear magnetic resonancePhysicsOptoelectronicsChromatographyLinguisticsComputer scienceAstronomyEmbedded systemQuantum mechanicsPhilosophyIron-based superconductors researchInorganic Chemistry and MaterialsRare-earth and actinide compounds