Large-scale optical characterization of solid-state quantum emitters
Madison Sutula, Ian Christen, Eric Bersin, Michael Walsh, Kevin C. Chen, Justin Mallek, Alexander Melville, Michael Titze, Edward S. Bielejec, Scott Hamilton, Danielle Braje, P. Ben Dixon, Dirk Englund
Topics & Concepts
Characterization (materials science)MicroscopeQuantumMaterials scienceScale (ratio)OptoelectronicsScalingComputer scienceChipPhotoluminescenceMicroscopyQuantum imagingQuantum efficiencyNanotechnologyQuantum technologyOpticsPhysicsTelecommunicationsOpen quantum systemGeometryQuantum mechanicsMathematicsQuantum Information and CryptographyQuantum and electron transport phenomenaPhotonic and Optical Devices