Interval-based scale-span topology optimization considering reliable manufacturing limits via the parameterized level set method and image recognition techniques
Zeshang Li, Lei Wang, Kaixuan Gu, Yaru Liu
Topics & Concepts
Parameterized complexitySpan (engineering)Topology optimizationInterval (graph theory)Scale (ratio)Set (abstract data type)Topology (electrical circuits)Image (mathematics)Level set (data structures)Level set methodMathematicsComputer scienceAlgorithmMathematical optimizationArtificial intelligenceEngineeringImage segmentationStructural engineeringCombinatoricsFinite element methodPhysicsQuantum mechanicsProgramming languageTopology Optimization in EngineeringManufacturing Process and OptimizationAdditive Manufacturing and 3D Printing Technologies