A Two-Stage Stochastic Programming Model of Component Test Plan and Redundancy Allocation for System Reliability Optimization
Aliakbar Eslami Baladeh, Enrico Zio
Abstract
This article presents a new two-stage stochastic model for the simultaneous optimization of component test plan and redundancy allocation. The optimal number of tests is determined for each component of the system in the first stage, and the system redundancy configuration is optimized in the second stage, after the realization of the system working condition. Scenario analysis is used for modeling variations in working conditions. A multiobjective reliability problem is formulated for series-parallel systems, and the allocation of redundancy is optimized by a genetic algorithm. The results of the feedback control system demonstrate the performance of the proposed model.
Topics & Concepts
Redundancy (engineering)Computer scienceMathematical optimizationComponent (thermodynamics)Test planReliability theoryReliability (semiconductor)Optimal allocationReliability engineeringGenetic algorithmEngineeringMathematicsFailure rateStatisticsQuantum mechanicsPower (physics)ThermodynamicsPhysicsWeibull distributionReliability and Maintenance OptimizationRisk and Safety AnalysisSoftware Reliability and Analysis Research