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Developing machine learning models with multi-source environmental data to predict wheat yield in China

Linchao Li, Bin Wang, Puyu Feng, De Li Liu, Qinsi He, Yajie Zhang, Yakai Wang, Siyi Li, Xiaoliang Lü, Chao Yue, Yi Li, Jianqiang He, Hao Feng, Guijun Yang, Qiang Yu

2022Computers and Electronics in Agriculture116 citationsDOI

Topics & Concepts

Normalized Difference Vegetation IndexVegetation (pathology)Environmental scienceYield (engineering)Predictive modellingSupport vector machineRandom forestEnhanced vegetation indexGrowing seasonCrop yieldSowingRemote sensingLeaf area indexAgronomyMathematicsStatisticsMachine learningVegetation IndexComputer scienceGeographyBiologyPathologyMaterials scienceMetallurgyMedicineRemote Sensing in AgricultureLand Use and Ecosystem ServicesClimate change impacts on agriculture
Developing machine learning models with multi-source environmental data to predict wheat yield in China | Litcius