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An Electromagnetic-Piezoelectric Hybrid Actuated Nanopositioner for Atomic Force Microscopy

Lingwen Tan, Xiangyuan Wang, Qi Yu, Bocheng Yu, Yixuan Meng, Linlin Li, Xinquan Zhang, Limin Zhu

2024IEEE Transactions on Instrumentation and Measurement35 citationsDOI

Abstract

An electromagnetic-piezoelectric hybrid actuated nanopositioner for atomic force microscopy (AFM) is proposed. Applying the hybrid serial-parallel-kinetic design, the parallel <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">xy</i> -stage is actuated by the normal-stressed electromagnetic actuators to conduct planar scanning in a large scope. The <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">z</i> -axis is serially carried by the <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">xy</i> -stage and is actuated by a piezoelectric actuator (PEA) to track the sample’s topography with high speed. Moreover, a novel flexure mechanism is proposed for motion guidance and decoupling of the <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">xy</i> -stage, featuring the higher resonant frequency along the <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">x</i> -axis to satisfy the requirement of a faster planar axis in AFM imaging. The analytical model of the nanopositioner is established to optimally determine the parameters, and the results are verified by finite-element analysis. A prototype is fabricated and tested. Experimental results demonstrate that the triaxial strokes of 94.4 μm (x-axis), 102.8 μm ( <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">y</i> -axis), and 5.22 μm ( <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">z</i> -axis) are achieved, and the resonant frequencies are identified as 735 Hz ( <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">x</i> -axis), 650 Hz ( <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">y</i> -axis), and 6340 Hz ( <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">z</i> -axis), respectively. The implemented feedback controllers ensure the accuracy of high-speed trajectory tracking. Finally, the AFM imaging based on the proposed nanopositioner is conducted, confirming its effectiveness for large-scope and high-rate AFM imaging.

Topics & Concepts

PiezoelectricityAtomic force microscopyMaterials scienceMicroscopyAtomic force acoustic microscopyAcousticsNon-contact atomic force microscopyConductive atomic force microscopyOptoelectronicsPhysicsOpticsMagnetic force microscopeNanotechnologyMagnetic fieldQuantum mechanicsMagnetizationForce Microscopy Techniques and ApplicationsAdhesion, Friction, and Surface InteractionsTribology and Wear Analysis