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ATUM-FIB microscopy for targeting and multiscale imaging of rare events in mouse cortex

Georg Kislinger, Helmut Gnägi, Martin Kerschensteiner, Mikael Simons, Thomas Misgeld, Martina Schifferer

2020STAR Protocols25 citationsDOIOpen Access PDF

Abstract

Here, we describe a detailed workflow for ATUM-FIB microscopy, a hybrid method that combines serial-sectioning scanning electron microscopy (SEM) with focused ion beam SEM (FIB-SEM). This detailed protocol is optimized for mouse cortex samples. The main processing steps include the generation of semi-thick sections from sequentially cured resin blocks using a heated microtomy approach. We demonstrate the different imaging modalities, including serial light and electron microscopy for target recognition and FIB-SEM for isotropic imaging of regions of interest. For complete details on the use and execution of this protocol, please refer to Kislinger et al. (2020).

Topics & Concepts

Scanning electron microscopeFocused ion beamMicroscopyMaterials scienceElectron microscopeBiomedical engineeringNanotechnologyOpticsChemistryIonMedicinePhysicsComposite materialOrganic chemistryAdvanced Electron Microscopy Techniques and ApplicationsAdvanced Fluorescence Microscopy TechniquesIntegrated Circuits and Semiconductor Failure Analysis
ATUM-FIB microscopy for targeting and multiscale imaging of rare events in mouse cortex | Litcius