METHODS OF RELIABILITY CONTROL IN CHIP DEVELOPMENT
Konstantin Zolnikov, Светлана Евдокимова, Tatyana Skvortsova, Alexander A. Gridnev
Abstract
The article considers the issues of reliability control in the development of chips. A reliability control scheme is provided for analyzing the States of major elements and accounting for failures. The paper describes the rejection tests, the sequence of their conduct, as well as the results of the analysis of methods and conditions of testing
Topics & Concepts
Reliability (semiconductor)Reliability engineeringControl (management)Computer scienceChipSequence (biology)Scheme (mathematics)EngineeringMathematicsArtificial intelligenceTelecommunicationsMathematical analysisBiologyGeneticsPhysicsPower (physics)Quantum mechanicsAerospace, Electronics, Mathematical Modeling