Sample capacity and anvil size effects for a standardized method to determine the delamination strength of 2G HTS coated conductors
Ce Sun, Cong Liu, Xingyi Zhang, Youhe Zhou
Topics & Concepts
Weibull distributionReliability (semiconductor)Sample size determinationReliability engineeringMaterials scienceSample (material)Function (biology)DissipationDelamination (geology)Weibull modulusStatisticsComputer scienceMathematicsEngineeringPhysicsThermodynamicsGeologyPaleontologyTectonicsSubductionEvolutionary biologyBiologyPower (physics)Superconducting Materials and ApplicationsPhysics of Superconductivity and MagnetismThermal Analysis in Power Transmission