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Drain current sensitivity analysis using a surface potential-based analytical model for AlGaN/GaN double gate MOS-HEMT

P. Sriramani, N. Mohankumar, Y. Prasamsha

2023Micro and Nanostructures18 citationsDOI

Topics & Concepts

Sensitivity (control systems)TransconductanceHigh-electron-mobility transistorMaterials scienceOptoelectronicsTransistorCurrent (fluid)ConductanceGallium nitrideLayer (electronics)NanotechnologyElectronic engineeringElectrical engineeringPhysicsVoltageEngineeringCondensed matter physicsGaN-based semiconductor devices and materialsSemiconductor materials and devicesMolecular Junctions and Nanostructures
Drain current sensitivity analysis using a surface potential-based analytical model for AlGaN/GaN double gate MOS-HEMT | Litcius