Parametric investigation and trap sensitivity of n-p-n double gate TFETs
Deepjyoti Deb, Rupam Goswami, Ratul Kr. Baruah, Kavindra Kandpal, Rajesh Saha
Topics & Concepts
Quantum tunnellingSilicon on insulatorSensitivity (control systems)Trap (plumbing)Parametric statisticsTransistorOptoelectronicsMaterials scienceSemiconductorField-effect transistorDopingNanotechnologySiliconPhysicsElectrical engineeringElectronic engineeringEngineeringMathematicsStatisticsVoltageMeteorologyAdvancements in Semiconductor Devices and Circuit DesignSemiconductor materials and devicesIntegrated Circuits and Semiconductor Failure Analysis