Ptychographic characterization of a coherent nanofocused X-ray beam
Alexander Björling, Sebastian Kalbfleisch, Maik Kahnt, Simone Sala, Karolis Parfeniukas, Ulrich Vogt, Dina Carbone, Ulf Johansson
Abstract
The NanoMAX hard X-ray nanoprobe is the first beamline to take full advantage of the diffraction-limited storage ring at the MAX IV synchrotron and delivers a high coherent photon flux for applications in diffraction and imaging. Here, we characterize its coherent and focused beam using ptychographic analysis. We derive beam profiles in the energy range 6-22 keV and estimate the coherent flux based on a probe mode decomposition approach.
Topics & Concepts
BeamlineOpticsCoherent diffraction imagingDiffractionSynchrotronBeam (structure)PtychographyPhysicsStorage ringSynchrotron radiationAdvanced Photon SourcePhoton fluxFlux (metallurgy)Photon countingPhotonMaterials sciencePhase retrievalFourier transformMetallurgyQuantum mechanicsAdvanced X-ray Imaging TechniquesAdvanced Electron Microscopy Techniques and ApplicationsCrystallography and Radiation Phenomena