Synthetic data augmentation to enhance manual and automated defect detection in microelectronics
Adrian Phoulady, Yara Suleiman, Hongbin Choi, Toni Moore, Nicholas May, Sina Shahbazmohamadi, Pouya Tavousi
Topics & Concepts
WorkflowScarcityMicroelectronicsIdentification (biology)Computer scienceReliability (semiconductor)DamagesRisk analysis (engineering)Quality (philosophy)Reliability engineeringData scienceArtificial intelligenceEngineeringBusinessDatabaseElectrical engineeringLawEconomicsEpistemologyMicroeconomicsPhysicsPhilosophyBotanyQuantum mechanicsBiologyPower (physics)Political sciencePhysical Unclonable Functions (PUFs) and Hardware SecurityIntegrated Circuits and Semiconductor Failure AnalysisIndustrial Vision Systems and Defect Detection