Electromagnetic scattering sensitivity analysis for perfectly conducting objects in TM polarization with isogeometric BEM
Leilei Chen, Chengmiao Liu, Haojie Lian, W. Y. Gu
Topics & Concepts
Isogeometric analysisScatteringPolarization (electrochemistry)PhysicsMathematical analysisOpticsMathematicsFinite element methodChemistryThermodynamicsPhysical chemistryElectromagnetic Scattering and AnalysisAdvanced Numerical Analysis TechniquesElectromagnetic Simulation and Numerical Methods