Flexoelectric effects in a bent <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML"><mml:mrow><mml:mi>α</mml:mi><mml:mtext>−</mml:mtext><mml:msub><mml:mi>In</mml:mi><mml:mn>2</mml:mn></mml:msub><mml:msub><mml:mi>Se</mml:mi><mml:mn>3</mml:mn></mml:msub></mml:mrow></mml:math> ferroelectric monolayer
Hongli Chen, Chen Hu, Li Chen, Liyuan Chen, Kai Jiang, Liangqing Zhu, Liyan Shang, Yawei Li, Junhao Chu, Shijing Gong, Zhigao Hu
Abstract
Flexoelectric effects in materials can bring novel physical properties that are absent in their perfect crystal, and have a wide range of applications, such as mechanical sensors and wrinkled triboelectric nanogenerators. In this work, electronic structures and transport properties of bended $\ensuremath{\alpha}\text{\ensuremath{-}}{\mathrm{In}}_{2}{\mathrm{Se}}_{3}$ monolayer are investigated through first-principles calculations and nonequilibrium Green's function (NEGF). We find that two different kinds of type-II band structures can be obtained in $\stackrel{\ifmmode \tilde{}\else \~{}\fi{}}{P}\ensuremath{\uparrow}$ and $\stackrel{\ifmmode \tilde{}\else \~{}\fi{}}{P}\ensuremath{\downarrow}$ flexed $\ensuremath{\alpha}\text{\ensuremath{-}}{\mathrm{In}}_{2}{\mathrm{Se}}_{3}$, which show opposite band bending. Carriers in the center of $\stackrel{\ifmmode \tilde{}\else \~{}\fi{}}{P}\ensuremath{\uparrow}$ and $\stackrel{\ifmmode \tilde{}\else \~{}\fi{}}{P}\ensuremath{\downarrow}$ flexed $\ensuremath{\alpha}\text{\ensuremath{-}}{\mathrm{In}}_{2}{\mathrm{Se}}_{3}$ are mainly holes and electrons, respectively, which dominate the current behavior of the $\ensuremath{\alpha}\text{\ensuremath{-}}{\mathrm{In}}_{2}{\mathrm{Se}}_{3}$ p-i-n (PIN) field-effect transistor (FET). The $\stackrel{\ifmmode \tilde{}\else \~{}\fi{}}{P}\ensuremath{\uparrow}$ PIN-FET has enhanced forward current and the rectification ratio due to the larger density of holes. Our study achieves the homogeneous junction through bended $\ensuremath{\alpha}\text{\ensuremath{-}}{\mathrm{In}}_{2}{\mathrm{Se}}_{3}$, which may simplify the device procession and be used as electromechanical sensors.