Litcius/Paper detail

A real-time anchor-free defect detector with global and local feature enhancement for surface defect detection

Qing Liu, Min Liu, Q.M. Jonathan, Weiming Shen, Weiming Shen

2024Expert Systems with Applications67 citationsDOI

Topics & Concepts

Feature (linguistics)DetectorComputer scienceArtificial intelligenceNoise (video)Pattern recognition (psychology)Field (mathematics)Feature extractionMathematicsTelecommunicationsImage (mathematics)Pure mathematicsPhilosophyLinguisticsIndustrial Vision Systems and Defect DetectionAdvanced Neural Network ApplicationsVisual Attention and Saliency Detection
A real-time anchor-free defect detector with global and local feature enhancement for surface defect detection | Litcius