Litcius/Paper detail

Double π-gate AlGaN/GaN HEMT with reduced surface and buffer traps and enhanced reliability

Rayabarapu Venkateswarlu, Bibhudendra Acharya, Guru Prasad Mishra

2024Microelectronics Reliability11 citationsDOI

Topics & Concepts

High-electron-mobility transistorOptoelectronicsReliability (semiconductor)Buffer (optical fiber)Materials scienceWide-bandgap semiconductorElectrical engineeringTransistorPower (physics)VoltagePhysicsEngineeringQuantum mechanicsGaN-based semiconductor devices and materialsSemiconductor Quantum Structures and DevicesSilicon Carbide Semiconductor Technologies
Double π-gate AlGaN/GaN HEMT with reduced surface and buffer traps and enhanced reliability | Litcius