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A comparison electric-dielectric features of Al/p-Si (MS) and Al/ (Al2O3:PVP)/p-Si (MPS) structures using voltage–current (V–I) and frequency–impedance (f–Z) measurements

Buket Akın, Javid Farazin, Ş. Altındal, Yashar Azizian‐Kalandaragh

2022Journal of Materials Science Materials in Electronics15 citationsDOI

Topics & Concepts

Dissipation factorElectric fieldEquivalent series resistanceAnalytical Chemistry (journal)Materials scienceDielectricPermittivityConductanceConductivityCapacitanceVoltageCondensed matter physicsChemistryElectrodeOptoelectronicsElectrical engineeringPhysicsEngineeringQuantum mechanicsPhysical chemistryChromatographySemiconductor materials and interfacesSemiconductor materials and devicesIntegrated Circuits and Semiconductor Failure Analysis
A comparison electric-dielectric features of Al/p-Si (MS) and Al/ (Al2O3:PVP)/p-Si (MPS) structures using voltage–current (V–I) and frequency–impedance (f–Z) measurements | Litcius