AM-SegNet for additive manufacturing <i>in situ</i> X-ray image segmentation and feature quantification
Wei Li, Rubén Lambert-Garcia, Anna C. M. Getley, Kwan Kim, Shishira Bhagavath, Marta Majkut, Alexander Rack, Peter Lee, Chu Lun Alex Leung
Abstract
Synchrotron X-ray imaging has been utilised to detect the dynamic behaviour of molten pools during the metal additive manufacturing (AM) process, where a substantial amount of imaging data is generated. Here, we develop an efficient and robust deep learning model, AM-SegNet, for segmenting and quantifying high-resolution X-ray images and prepare a large-scale database consisting of over 10,000 pixel-labelled images for model training and testing. AM-SegNet incorporates a lightweight convolution block and a customised attention mechanism, capable of performing semantic segmentation with high accuracy (∼96%) and processing speed (< 4 ms per frame). The segmentation results can be used for quantification and multi-modal correlation analysis of critical features (e.g. keyholes and pores). Additionally, the application of AM-SegNet to other advanced manufacturing processes is demonstrated. The proposed method will enable end-users in the manufacturing and imaging domains to accelerate data processing from collection to analytics, and provide insights into the processes’ governing physics.