Remaining useful life prediction for stochastic deteriorating Devices: A direct approach via inverse degradation modeling
Tianmei Li, Zhenyu Cai, Zhaoju Zeng, Zhengxin Zhang, Xiaosheng Si
Topics & Concepts
Degradation (telecommunications)InverseComputer scienceReliability engineeringEconometricsEngineeringMathematicsElectronic engineeringGeometryReliability and Maintenance OptimizationNon-Destructive Testing TechniquesLife Cycle Costing Analysis