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Ultra-sensitive heterojunction double gate BioTFET device for SARS-CoV-2 biomolecules detection

P. Vimala, A. Sharon Geege, N. Mohankumar, T. S. Arun Samuel, T. Ananth Kumar, P. Suveetha Dhanaselvam, I. Vivek Anand

2025Scientific Reports11 citationsDOIOpen Access PDF

Abstract

The persisting SARS-CoV-2 genetic mutation could unintentionally increase human transmission, mortality, and aggravation. Since no specific pharmaceutical therapies or vaccinations exist, rapid detection and successful treatment are essential for managing the COVID-19 pandemic. BioTFETs exhibit superior sensitivity and faster response times than bioFETs, which are more vulnerable to substantial subthreshold swing and short-channel effects. This article presents the Dielectrically Modulated-Double Gate-Heterojunction-Tunnel FET-based biosensor (DG-bioHTFET) specifically engineered to identify and detect the nucleocapsid protein and RNA biomolecules with specific permittivity (k) of SARS-CoV-2 biomolecules embedded in the nanogaps. At V gs = 1.5 V, the proposed device achieves a drain current (I ds ) of 2.32 × 10 − 5 A/µm. At k = 5 and k = 3.64, the I ON /I OFF ratios are 3.550 × 10 5 and 3.403 × 10 5 , respectively. The data suggest that the device exhibits increased sensitivity to biomolecules possessing elevated dielectric constants. It is feasible to design ultra-sensitive TFET biosensors as a bio-recognition unit, which offers the benefits of rapid label-free detection and high sensitivity. The device exhibits superior performance in terms of high drain current with enhanced sensitivity for precise biosensing applications.

Topics & Concepts

BiomoleculeSevere acute respiratory syndrome coronavirus 2 (SARS-CoV-2)Coronavirus disease 2019 (COVID-19)Optoelectronics2019-20 coronavirus outbreakHeterojunctionNanotechnologyMaterials scienceBiologyVirologyMedicineInfectious disease (medical specialty)OutbreakPathologyDiseaseAdvancements in Semiconductor Devices and Circuit DesignNanowire Synthesis and ApplicationsIntegrated Circuits and Semiconductor Failure Analysis