Cracking detection of unidirectionally reinforced SiC/SiC composite by X-ray Talbot–Lau interferometry
Masaki Kotani, Yoshihisa Tanaka, Hiroshi Hatta, Yutaka Kagawa
Topics & Concepts
Materials scienceCrackingComposite numberInterferometryComposite materialX-rayOpticsPhysicsAdvanced Surface Polishing TechniquesIntegrated Circuits and Semiconductor Failure AnalysisAdvanced X-ray Imaging Techniques