Electron-beam-induced cracking in organic-inorganic halide perovskite thin films
Srinivas K. Yadavalli, Min Chen, Mingyu Hu, Zhenghong Dai, Yuanyuan Zhou, Nitin P. Padture
Topics & Concepts
CrackingScanning electron microscopeMaterials scienceHalideThin filmGrain boundaryPerovskite (structure)ShrinkageGrain sizeComposite materialVolatilisationMineralogyChemical engineeringNanotechnologyMicrostructureInorganic chemistryChemistryEngineeringOrganic chemistryPerovskite Materials and ApplicationsChalcogenide Semiconductor Thin FilmsQuantum Dots Synthesis And Properties