Litcius/Paper detail

Comparison and validation of stochastic microstructure characterization and reconstruction: Machine learning vs. deep learning methodologies

Arulmurugan Senthilnathan, Vishnu Saseendran, Pınar Acar, Namiko Yamamoto, Veera Sundararaghavan

2024Acta Materialia13 citationsDOI

Topics & Concepts

Materials scienceCharacterization (materials science)MicrostructureArtificial intelligenceMachine learningMetallurgyNanotechnologyComputer scienceMachine Learning in Materials ScienceElectron and X-Ray Spectroscopy TechniquesAdvanced X-ray and CT Imaging