Reliability analysis for a system experiencing dependent degradation processes and random shocks based on a nonlinear Wiener process model
Fuqiang Sun, Hao Li, Yuanyuan Cheng, Haitao Liao
Topics & Concepts
Nonlinear systemCopula (linguistics)Wiener processReliability (semiconductor)Degradation (telecommunications)Stochastic processProcess (computing)Reliability engineeringComplex systemComputer scienceStatistical physicsEngineeringMathematicsApplied mathematicsEconometricsStatisticsPhysicsElectronic engineeringPower (physics)Operating systemQuantum mechanicsArtificial intelligenceReliability and Maintenance OptimizationStatistical Distribution Estimation and ApplicationsRisk and Safety Analysis