Key-Performance-Indicator-Related Process Monitoring Based on Improved Kernel Partial Least Squares
Yabin Si, Youqing Wang, Donghua Zhou
Abstract
Although the partial least squares approach is an effective fault detection method, some issues of nonlinear process monitoring related to key performance indicators (KPIs) still exist. To address the nonlinear characteristics in the industrial processes, kernel partial least squares (KPLS) method was proposed in the literature. However, the KPLS method also faces some difficulties in fault detection. None of the existing KPLS methods can accurately decompose measurements into KPI-related and KPI-unrelated parts, and these methods usually ignore the fact that the residual subspace still contains some KPI-related information. In this article, a new improved KPLS method, which considers the KPI-related information in the residual subspace, has been proposed for KPI-related process monitoring. First, the proposed method performs general singular value decomposition (GSVD) on the calculable loadings based on the kernel matrix. Next, the kernel matrix can be suitably divided into KPI-related and KPI-unrelated subspaces. Besides, we present the design of two statistics for process monitoring as well as a detailed algorithm performance analysis for kernel methods. Finally, a numerical case and Tennessee Eastman benchmark process demonstrate the efficacy and merits of the improved KPLS-based method.