A FinFET-based low-power, stable 8T SRAM cell with high yield

E. Mani, N. Padmaja, Shaik Javid Basha, Mohammed A. El-Meligy, Haitham A. Mahmoud

2023AEU - International Journal of Electronics and Communications23 citationsDOI

Topics & Concepts

Static random-access memoryTransmission gateCMOSComputer scienceDecoupling (probability)Leakage (economics)TransistorLeakage powerElectronic engineeringDissipationElectrical engineeringVoltageEmbedded systemComputer hardwareEngineeringPhysicsEconomicsMacroeconomicsControl engineeringThermodynamicsSemiconductor materials and devicesLow-power high-performance VLSI designFerroelectric and Negative Capacitance Devices