A mean shift algorithm for drift correction in localization microscopy
F. Fazekas, Thomas R. Shaw, Sumin Kim, Ryan A Bogucki, Sarah L. Veatch
Abstract
Single-molecule localization microscopy techniques transcend the diffraction limit of visible light by localizing isolated emitters sampled stochastically. This time-lapse imaging necessitates long acquisition times, over which sample drift can become large relative to the localization precision. Here, we present an efficient and robust method for estimating drift, using a simple peak-finding algorithm based on mean shifts that is effective for single-molecule localization microscopy in two or three dimensions.
Topics & Concepts
MicroscopyDiffractionAlgorithmLimit (mathematics)Simple (philosophy)Photoactivated localization microscopyPhysicsOpticsStatistical physicsComputer scienceSuper-resolution microscopyMathematicsMathematical analysisScanning confocal electron microscopyPhilosophyEpistemologyAdvanced Fluorescence Microscopy TechniquesNear-Field Optical MicroscopyAdvanced Electron Microscopy Techniques and Applications