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Analyzed electrical performance and induced interface passivation of fabricated Al/NTCDA/p-Si MIS–Schottky heterojunction

Ahmed M. Nawar, Mohamed Abd-Elsalam, Ahmed M. El-Mahalawy, M.M. El-Nahass

2020Applied Physics A46 citationsDOI

Topics & Concepts

Nanocrystalline materialSchottky barrierHeterojunctionMaterials scienceSchottky diodeSaturation currentAnalytical Chemistry (journal)CrystalliteThin filmTransmission electron microscopyEquivalent series resistanceCondensed matter physicsDiodeChemistryOptoelectronicsNanotechnologyVoltagePhysicsMetallurgyQuantum mechanicsChromatographySemiconductor materials and interfacesSilicon Nanostructures and PhotoluminescenceSilicon and Solar Cell Technologies
Analyzed electrical performance and induced interface passivation of fabricated Al/NTCDA/p-Si MIS–Schottky heterojunction | Litcius