Probing charge traps at the 2D semiconductor/dielectric interface
J. John, Abhishek Mishra, Rousan Debbarma, Ivan Verzhbitskiy, Kuan Eng Johnson Goh
Abstract
The presence of charge traps at the 2D semiconductor/dielectric interface poses a significant obstacle for device optimisation. Hence, methods to accurately measure and assess these interface traps are in demand.
Topics & Concepts
Interface (matter)SemiconductorDielectricMaterials scienceCharge (physics)OptoelectronicsObstacleMeasure (data warehouse)Engineering physicsNanotechnologyComputer sciencePhysicsComposite materialLawPolitical scienceQuantum mechanicsCapillary numberCapillary actionDatabaseSemiconductor materials and devicesElectronic and Structural Properties of OxidesAdvanced Memory and Neural Computing