Litcius/Paper detail

XPS fast depth profile of the native oxide layers on AISI 304, 316 and 430 commercial stainless steels and their evolution with time

Simon Detriche, S. Vivegnis, J.-F. Vanhumbeeck, Alexandre Felten, Pierre Louette, Frank Uwe Renner, J. Delhalle, Zineb Mekhalif

2020Journal of Electron Spectroscopy and Related Phenomena62 citationsDOIOpen Access PDF

Topics & Concepts

X-ray photoelectron spectroscopyOxideMaterials sciencePolishingContact angleCorrosionLayer (electronics)Chemical stateMetallurgyChemical engineeringAnalytical Chemistry (journal)NanotechnologyComposite materialChemistryEnvironmental chemistryEngineeringElectron and X-Ray Spectroscopy TechniquesCorrosion Behavior and InhibitionHydrogen embrittlement and corrosion behaviors in metals