Crystallization and bandgap variation of non-stoichiometric amorphous Ga2O3-x thin films during post-annealing process
Hojoon Lim, Dongwoo Kim, Su Yeon, Bongjin Simon Mun, Do Young Noh, Hyon Chol Kang
Topics & Concepts
X-ray photoelectron spectroscopyAmorphous solidMaterials scienceThin filmAnnealing (glass)StoichiometryAnalytical Chemistry (journal)CrystallizationBand gapChemical stateSputteringCrystallographyChemical engineeringChemistryNanotechnologyOptoelectronicsPhysical chemistryMetallurgyEngineeringChromatographyGa2O3 and related materialsZnO doping and propertiesAdvanced Photocatalysis Techniques