A Review on Recent Advances in Vision-based Defect Recognition towards Industrial Intelligence
Yiping Gao, Xinyu Li, Xi Vincent Wang, Lihui Wang, Liang Gao
Topics & Concepts
Computer scienceArtificial intelligenceData scienceEngineeringIndustrial Vision Systems and Defect DetectionIntegrated Circuits and Semiconductor Failure AnalysisManufacturing Process and Optimization