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X-ray diffraction based Williamson–Hall analysis and rietveld refinement for strain mechanism in Mg–Mn co-substituted CdFe2O4 nanoparticles

Kirti Desai, S. T. Alone, Santosh R. Wadgane, Sagar E. Shirsath, Khalid Mujasam Batoo, Ali Imran, Emad H. Raslan, Muhammad Hadi, Muhammad Farzik Ijaz, R.H. Kadam

2021Physica B Condensed Matter139 citationsDOI

Topics & Concepts

Materials scienceRietveld refinementNanocrystalline materialBulk modulusDiffractionSpinelElastic modulusCrystallographyShear modulusOctahedronDebye modelPoisson's ratioComposite materialThermodynamicsChemistryNanotechnologyOpticsPhysicsCrystal structurePoisson distributionMetallurgyMathematicsStatisticsMagnetic Properties and Synthesis of FerritesMultiferroics and related materialsX-ray Diffraction in Crystallography
X-ray diffraction based Williamson–Hall analysis and rietveld refinement for strain mechanism in Mg–Mn co-substituted CdFe2O4 nanoparticles | Litcius