Optimizing exposure times of structured light metrology systems using a digital twin
Nishant Ojal, Pigeon Caviness, Alexander S. Blum, Brian Au, Adam W. Jaycox, Brian Giera
Topics & Concepts
MetrologyComputer scienceMetric (unit)Structured lightRay tracing (physics)Range (aeronautics)TracingReal-time computingComputer engineeringArtificial intelligenceEngineeringMathematicsStatisticsOperating systemPhysicsAerospace engineeringOperations managementQuantum mechanicsAdvanced Optical Sensing TechnologiesOptical measurement and interference techniquesSurface Roughness and Optical Measurements