A high-accuracy and lightweight detector based on a graph convolution network for strip surface defect detection
Guan-Qiang Wang, Chizhou Zhang, Ming-Song Chen, Y.C. Lin, Xian-Hua Tan, Yuxin Kang, Qiu Wang, Weidong Zeng, Weiwei Zhao
Topics & Concepts
Convolution (computer science)Computer scienceSeparable spaceDetectorArtificial intelligenceFeature (linguistics)GraphReduction (mathematics)Pattern recognition (psychology)Surface (topology)AlgorithmComputer visionMathematicsGeometryArtificial neural networkTheoretical computer scienceLinguisticsPhilosophyTelecommunicationsMathematical analysisIndustrial Vision Systems and Defect DetectionAdvanced Neural Network ApplicationsSurface Roughness and Optical Measurements