Exploring the degradation of silver nanowire networks under thermal stress by coupling <i>in situ</i> X-ray diffraction and electrical resistance measurements
Laetitia Bardet, Hervé Roussel, Stefano Saroglia, Masoud Akbari, David Muñoz‐Rojas, Carmen Jiménez, Aurore Denneulin, Daniel Bellet
Abstract
-coated AgNW networks appears very similar to the thermal expansion of bulk Ag. Our findings provide insights into the underlying failure mechanisms of AgNW networks subjected to thermal stress, helping researchers to develop more robust and durable TEs based on metallic nanowire networks.
Topics & Concepts
Degradation (telecommunications)In situMaterials scienceCoupling (piping)DiffractionThermalStress (linguistics)Electrical resistance and conductanceNanowireNanotechnologyCrystallographyComposite materialChemistryOpticsPhysicsElectronic engineeringEngineeringThermodynamicsOrganic chemistryPhilosophyLinguisticsNanomaterials and Printing TechnologiesThin-Film Transistor TechnologiesElectronic Packaging and Soldering Technologies